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Digitimes September 3, 2026 By Charlene Chen neutral

CHPT spans wafer to system-level testing

AI / LLMSemiconductorsMemoryData Center
Chunghwa Precision Test Tech showcased a range of test interface solutions for AI chips and high-performance computing (HPC) at SEMICON Taiwan 2026, including AI probe cards, memory probe cards, high-pin-count probe cards, and a high-power burn-in board for AI ASICs.
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