ORNL: AI Helps Microscopes Find the Most Informative Nanoscale Features

<p>SimuScan uses realistic synthetic data to train AI to identify important nanoscale features and guide atomic force microscopes toward the most informative regions of a sample Sept. 10, 2026 &#8212; Researchers at the Department of Energy’s (DOE) Oak Ridge National Laboratory (ORNL) have developed an artificial intelligence framework that helps researchers use atomic force microscopes to [&#8230;]</p> <p>The post <a href="https://www.hpcwire.com/off-the-wire/ornl-ai-helps-microscopes-find-the-most-informative-nanoscale-features/">ORNL: AI Helps Microscopes Find the Most Informative Nanoscale Features</a> appeared first on <a href="https://www.hpcwire.com">HPCwire</a>.</p>