Wooptix Brings Astronomy Optics to Wafer Metrology

<p>Wavefront phase imaging captures 16 million data points in a single shot, aiming at in-line shape and stress measurement on every wafer</p> <p>The post <a href="https://www.semiconductor-digest.com/wooptix-brings-astronomy-optics-to-wafer-metrology/">Wooptix Brings Astronomy Optics to Wafer Metrology</a> appeared first on <a href="https://www.semiconductor-digest.com">Semiconductor Digest</a>.</p>