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EE Times November 13, 2026 By Infineon Technologies negative

NewSpace-Grade NOR Flash: Right-Sized Reliability for Space Missions

AI / LLMMemoryEdge AI
<p>This paper first examines how total ionizing dose and single-event effects degrade NOR Flash. It focuses on the charge pumps, sense amplifiers, and control logic that often fail before the storage array does. It then presents a method for deriving radiation requirements from four mission inputs (orbit, lifetime, shielding, and risk tolerance) instead of applying [&#8230;]</p> <p>The post <a href="https://www.eetimes.com/newspace-grade-nor-flash-right-sized-reliability-for-space-missions/">NewSpace-Grade NOR Flash: Right-Sized Reliability for Space Missions</a> appeared first on <a href="https://www.eetimes.com">EE Times</a>.</p>
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