Self-Heating And Parasitics Challenge Multi-Tier CFET Scaling (TU Munich, IIT Kanpur)
<p>Researchers at the Technical University of Munich and Indian Institute of Technology Kanpur published “Self-Heating and Parasitic Effects in Multi-Tier CFET Design.” Abstract Excerpt: “We study the impact of self-heating effects (SHEs) and middle of line (MOL) and back-end of line (BEOL) induced parasitics on multi-tier CFET design, where multiple nanosheet devices are vertically stacked.... <a class="read_more" href="https://semiengineering.com/self-heating-and-parasitics-challenge-multi-tier-cfet-scaling-tu-munich-iit-kanpur/">» read more</a></p>
<p>The post <a href="https://semiengineering.com/self-heating-and-parasitics-challenge-multi-tier-cfet-scaling-tu-munich-iit-kanpur/">Self-Heating And Parasitics Challenge Multi-Tier CFET Scaling (TU Munich, IIT Kanpur)</a> appeared first on <a href="https://semiengineering.com">Semiconductor Engineering</a>.</p>
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